IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 272 - 276
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 252 - 257
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 258 - 265
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 266 - 271
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 245 - 251
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 236 - 244
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 231 - 235
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 1 - 8
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 9 - 17
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 322 - 326
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 277 - 286
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 287 - 292
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 310 - 315
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 301 - 309
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 330 - 332
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 335
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > C1 - C4
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 327 - 329
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 333 - 334
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 336