IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 266 - 276
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 4 > 528 - 533
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 97 - 104
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 304 - 309
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 407 - 419
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 420 - 428
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 416 - 425
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 356 - 360
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 33 - 39
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 222 - 232
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 81 - 85
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 236 - 243
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 437 - 444
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 362 - 369
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 136 - 141
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 319 - 325
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 529 - 535
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 583 - 587
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 758 - 762