IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 123 - 131
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 132 - 135
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 138 - 145
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 242 - 251
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 488 - 493
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 407 - 419
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 399 - 406
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 240 - 247
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 491 - 500
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 128 - 134
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 163 - 170
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 356 - 360
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 164 - 170
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 62 - 70
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 18 - 25
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 287 - 294
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 222 - 232
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 290 - 294
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 323 - 334