The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Due to a weak adhesion, the delamination occurred frequently in the interface between the epoxy compounds and lead that results in a performance failure normally. Several treatments, such as plasma and chemical modifications, have been developed and applied to enhance the bonding force in the interface of both materials. In this study, an anchor shape of the lead, as a mechanical locking microstructure,...
Soft soldering is still the standard bonding method in order to provide a large void-free joining area in power electronics module applications. Ag sintering has been proven for small-area die attach applications to increase junction temperature and reliability. In this paper, we explore silver sintering technology further for large-area high-temperature substrate bonding in order to enable full benefits...
Recent advancements in automotive technologies, most notably autonomous driving, demand electronic systemsmuch more complex than realized in the past. The automotiveindustry has been forced to adopt advanced consumerelectronics to satisfy the demand, and thus it becomes morechallenging to assess system reliability while adopting the newtechnologies. The system level reliability can be enforced byimplementing...
The objective of this work is to develop a combinedmode I and mode III characterization method and to use thistest method to study Copper (Cu) / Epoxy mold compound(EMC) interfacial delamination from near-mode I to nearmodeIII global loading. Using the developed test method, aseries of experiments are done with varying loading modeconditions from near-mode I to near-mode III and successfuldelamination...
Molded underfill (MUF) is one of the most effective molding technologies in the advanced packaging industry. Developing highly reliable MUF is still challenging due to all basic requisitions of semiconductor packaging. Among all these requirements, controlling interfacial delamination between materials in integrated circuits (IC) packages has been considered to be the most important challenge to be...
Emerging fan-out packages require advances in mold compounds, polymer interfaces to metals and silicon, and innovative processing to reach the required high reliability. In this paper, we discuss the fracture energy for mold compound interface to copper and silicon, and use that information for studying interfacial delamination propagation of mold compound. We have examined mold compound delamination...
Silver sintering become a mature interconnection technology for high reliability or high temperature electronic devices. Different sintering processes are applied depending upon application requirements, for instance pressure sintering process is optimized for elevated life time power modules. The pressure of the sintering process can be adjusted in order to modify the properties of the sinter layer...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.