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Random variation of threshold voltage (Vt) in MOSFETs plays a central role in determining the minimum operating voltage of products in a given process technology. Properly characterizing Vt variation requires a large volume of measurements of minimum size devices to understand the high sigma behavior. At the same time, a rapid measurement approach is required to keep the total measurement time practical...
Brain-inspired non-Boolean computing paradigms are gaining wide interest due to their error resilient nature and massive parallelism. This work explores oxide-based compact oscillators for oscillatory neural networks (ONN). We demonstrate for the first time, best in class high-frequency performance at 500 MHz and low power (< 200 µW). The superior figures of merit are achieved due to device engineering...
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