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State of the art automotive microcontrollers (MCUs) implementing complex system-on-chip (SoC) architectures requires often additional functional patterns to achieve high degree of reliability. Functional pattern family includes test patterns checking internal device functionality under nominal condition. The development of these patterns is required to augment structural tests to achieve high test...
As scan compression matures, the focus is changing from delivering QoR to other pressing requirements like hierarchical DFT implementation, pin-limited test and enabling high speed shifting of scan chains. Combinational compression schemes have had great success in the last decade in delivering a solution that provided a fast transition from traditional scan based test to compression based test. In...
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