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With the increasing complexity of VLSI circuits and systems, their testing is becoming increasingly complex and time consuming. Apart from affecting the design turn-around time, it poses severe challenges to the test engineers in terms of meeting the power-budget and temperature limit of the chip. Power consumption during test is often much higher than in normal mode of operation. Increasing temperature...
With the widespread use of applications like internet banking, secured communication, emails, etc. information security is important concern. Security of information depends on implementation of cryptographic algorithm and its complexity to solve in reverse direction. However, with the use of current high speed computational resources it is possible to carry out brute-force attack and various other...
Increase in design complication for current and future era of microelectronics technologies and mechanisms used for data transmission leads to an increased sensitivity to bit-flip errors. As we know, multiple cores are built in a single system on chip (SoC) and to test that SoC, test vectors are transferred from automatic test equipment (ATE) via serial communication link. Now if there is a defect...
Traditionally BIST is most widely used testing methodology because of its online and at speed testing capability. The conventional BIST suffers from hardware overhead due to the presence of on-chip test blocks such as TPG, MISR, ROM and ORA. In this paper a low hardware cost BIST is proposed, which eliminates the requirement of external TPG by reconfiguring the first flops of scan chains as TPG and...
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