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We introduce a scheme to overcome the challenges of ancillae preparation in traditional spectrally-sheared interferometry techniques for pulse characterization. The approach, applied to two-dimensional spectral shearing interferometry, reliably characterizes few-optical-cycle pulses from UV to IR.
We demonstrated an integrated system that can manipulate and measure vectorial field spanning up to the entire repetition period without ambiguity, iteration, and reference.
The laser pulse width was measured on-site the mass spectrometer by scanning a dispersion in the pulse compressor. A pulse width of 49 fs measured was close to 35 fs calculated from the spectrum.
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