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Structural test is the most efficient test to detect manufacturing defects. With ever increasing complexity of digital designs, structural test vectors alone are not sufficient to achieve the desired fault coverage. Functional test vectors are programs written with the design specifications in mind rather than manufacturing defects and this can help in testing some of the critical portions of design...
Design for Testability (DFT) based on scan and ATPG has been adopted as a reliable and broadly acceptable methodology that provides very high test coverage, but for large circuits, the growing test data volume causes a significant increase in test cost because of much longer test time and elevated tester memory requirements. Test compression or scan compression provides great reduction in test data...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.