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In our previous report on an integrated localization using laser range scanners (LRS) and odometry, a variable covariance depending on the number of data, predicted incident angle, and predicted distance of LRS is introduced to EKF to deal with their effects on the localization. In the present paper, this method is applied to a front steering vehicle navigated by the LRS localization and odometry...
Atomic Force Microscope (AFM) is the device which can be applied to measure the surface topography of samples in nano-scale. Because the cantilever holds its physical contact with samples, it is also possible to measure elasticity of samples in principle. However, compared with the implovement of scanning performance, the technologies for viscosity and elasticity measurements are still underdeveloped...
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