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The IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML (IEEE Std 1671™-2010) and all its `dot' standards have been published and are available from the IEEE. The ATML standards working group is now revising these trial use `dot' standards to match their current XML schemas in line with the full use IEEE Std 1671. The "Common"...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.