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This paper will describe the Integrated Process Team developed between the US Air Force VDATS program team and the Lockheed Martin LM-STAR team. Independently, both groups have designed a common ATS solution to reverse the excessive life cycle sustainment costs associated with the proliferation of unique test systems throughout their customer base. Both groups recognized the similarities in instrumentation,...
How to identify when a static pattern digital test program should be re-hosted as a dynamic pattern set on the state-of-the-art ATE is complicated. However, there are critical issues that should be evaluated when making this decision. Issues include chip models, timing parameters, drive strength, logic levels, circuit complexity, I/O pins, automated diagnostics, portability, reuse, speed, optimal...
Today's fast paced world of ever changing Commercial-Of-The-Shelf (COTS) hardware and software architectures creates a quandary in that the end-user must be cognizant of these effects on their own legacy based system when embracing a new design. The advantages of moving to a newer and sleeker system surely outweigh the complexities of attempting to maintain an older system especially when obsolescence...
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