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The thermomechanical fatigue of solder joints on the system level is more complex to predict than on the board level. The damage of the solder joints of an electronic device in an ECU (electronic control unit) depends on the thermal expansion mismatch between the materials of the device and the PCB (printed circuit board), so called local mismatch, as well as on the global deformation of the PCB induced...
This investigation is aimed at the stability of press-fit interconnections for MID. Moulded interconnect devices (MID) are 3-dimensional substrates produced by thermoplastic injection moulding for large-series applications. The assembly process of press-fit interconnections has been correctly modelled with a FE-Software. With this model the behaviour of the mechanical contact pressure, which decreases...
The lifetime of a solder joint is mainly determined by its creep behaviour. Creep arises from the stresses inside the solder joints as a consequence of the thermomechanical mismatch of the board and the substrate. The stress state is heavily influenced by the anisotropy of tin. To understand the damage process in solder joints, the influence of the anisotropic microstructure must be understood. In...
The paper presents extended creep properties of eutectic SnAg3.8Cu0.7 solder using dog bone shaped tensile specimen to extend the data for the Alpha-Omega Model. The tensile test machine was carefully modified with respect of solder material requirements in terms of stress free specimen mounting and assurances of high stable stress conditions. Furthermore the tensile tester is able to measure the...
The paper reports the results of a systematic improvement project on the thermal cycle (TC) lifetime prediction of BGA memory modules with SnAg1.0Cu0.5 and SnAg1.0Cu0.5Ni0.05 solder alloys. The pre-existing lifetime modeling scheme allowed predictions with an inaccuracy factor of about 1.6plusmn1 on average while in TC experiments, the characteristic lifetime, N63, showed a standard deviation of about...
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