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The study on small molecular space morphology of nanometer material by a high-resolution Atomic Force Microscopy (AFM) is introduced in this paper. The high-resolution AFM.IPC-208B was developed by Chongqing University, and its precision: lateral resolution is 0.1 nm, vertical resolution is 0.01 nm. Applying AFM.IPC-208B, we obtained the surface structures of five samples (natural white mica, polyimide,...
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