Nanocrystalline of TiO2 thin films have been prepared by sol-gel dip coating technique. The problem is the TiO2 thin films have received considerable attention of phase crystallinity because of their potential applications and proven in certain areas. It has been discussed throughout the years based on the application devices. In this study, the TiO2 thin films were varied in different molarities concentration and different number of layers towards the phase crystallinity. The deposited films were characterized using X-ray diffraction (XRD), UV-Vis Spectrometer and Field Emission Scanning Electron Microscope (FESEM). Result showed the effect of molarities concentration and numbers of layers changed the phase crystalline from amorphous into anatase (A) and Rutile (R) at 450°C with 0.50M and 2 layers thin films.