2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) > 221 - 223
Source
Abstract
Identifiers
book e-ISBN : | 978-1-5386-1810-3 |
DOI | 10.1109/SCM.2017.7970543 |
book e-ISBN : | 978-1-5386-1810-3 |
DOI | 10.1109/SCM.2017.7970543 |