The space radiation induced displacement damage effects on the performance of the Silicon Drift Detector (SDD) based X-ray spectrometer has been studied using X-ray (Fe-55) and gamma ray (Co-60) radiations. The spectroscopic performance of the SDD based spectrometer degrades due to radiation damage during the transit and in-orbit operations. Silicon detectors are sensitive to displacement damage which is due to the non ionizing energy loss of the incident radiation. The displacement damage increases the leakage current of the SDD and hence the energy resolution. The X-ray irradiation is to quantify the X-ray fluence level up to which the SDD provides stable energy resolution. After X-ray irradiation tests, it is observed that there is no change in the leakage current and the energy resolution for dose up to 64 krad. The gamma ray irradiation test is to quantify the space radiation damage effects on the SDD and shown that the energy resolution degrades from ∼160 eV at 5.9 keV to ∼210 eV for the detector operating temperature of ∼−40°C for the gamma ray dose of ∼10 Krad. It is observed that the increase in the leakage current due to displacement damage is ∼0.15 pA and its contribution to the degradation in the energy resolution is insignificant. The degradation in the energy resolution is attributed to the radiation damage of the electronic components inside the SDD module and meets the Chandrayaan-2 requirement of < 250 eV for the mission life of 2 years.