This paper explores the impact of device process variations on the performance of analog circuits. We propose a new verification approach called Cross Recurrence Verification (CRV). Circuit output similarities between an ideal circuit that has parameters set to the nominal values and a non-ideal circuit with process variation due to 65nm fabrication process are computed. CRV is used to find the percentage of recurrence and the longest common output subsequence that matches the output subsequence of an ideal circuit. The performed analysis showed the potential of this novel technique to enhance/improve the verification process of Analog circuits. The proposed approach is illustrated on a five stage ring oscillator. The obtained results demonstrate the robustness, accuracy and flexibility of our methodology.