2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) > 37 - 42
Source
Abstract
Identifiers
book ISSN : | 1071-9032 |
book e-ISSN : | 1071-9032 |
book ISBN : | 978-1-4673-4845-4 |
book e-ISBN : | 978-1-4673-4848-5 , 978-1-4673-4847-8 |
DOI | 10.1109/ICMTS.2013.6528142 |