2012 IEEE 21st Asian Test Symposium > 350 - 354
Source
Abstract
Identifiers
book ISSN : | 1081-7735 |
book e-ISSN : | 1081-7735 |
book ISBN : | 978-1-4673-4555-2 |
book e-ISBN : | 978-0-7695-4876-0 |
DOI | 10.1109/ATS.2012.66 |
2012 IEEE 21st Asian Test Symposium > 350 - 354
book ISSN : | 1081-7735 |
book e-ISSN : | 1081-7735 |
book ISBN : | 978-1-4673-4555-2 |
book e-ISBN : | 978-0-7695-4876-0 |
DOI | 10.1109/ATS.2012.66 |