The 16th North-East Asia Symposium on Nano, Information Technology and Reliability > 112 - 117
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ISBN książki : | 978-1-4577-0793-3 |
e-ISBN książki : | 978-89-88678-63-3 , 978-89-88678-62-6 |
DOI | 10.1109/NASNIT.2011.6111131 |