2011 IEEE 17th International On-Line Testing Symposium > 228 - 233
Source
Abstract
Identifiers
book ISBN : | 978-1-4577-1053-7 |
book e-ISBN : | 978-1-4577-1056-8 , 978-1-4577-1055-1 |
DOI | 10.1109/IOLTS.2011.5994534 |
book ISBN : | 978-1-4577-1053-7 |
book e-ISBN : | 978-1-4577-1056-8 , 978-1-4577-1055-1 |
DOI | 10.1109/IOLTS.2011.5994534 |