Proceedings of IEEE East-West Design&Test Symposium (EWDTS'08) > 196 - 199
Source
Abstract
Identifiers
book ISBN : | 978-1-4244-3402-2 |
book e-ISBN : | 978-1-4244-3403-9 |
DOI | 10.1109/EWDTS.2008.5580139 |
book ISBN : | 978-1-4244-3402-2 |
book e-ISBN : | 978-1-4244-3403-9 |
DOI | 10.1109/EWDTS.2008.5580139 |