2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits > 1 - 4
Source
Abstract
Identifiers
book ISSN : | 1946-1542 |
book ISBN : | 978-1-4244-5596-6 |
book e-ISBN : | 978-1-4244-5598-0 , 978-1-4244-5597-3 |
DOI | 10.1109/IPFA.2010.5532246 |