2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits > 667 - 671
Source
Abstract
Identifiers
book ISSN : | 1946-1542 |
book ISBN : | 978-1-4244-3911-9 |
book e-ISBN : | 978-1-4244-3912-6 |
DOI | 10.1109/IPFA.2009.5232551 |