2009 International Symposium on VLSI Design, Automation and Test > 166 - 169
Source
Abstract
Identifiers
book ISBN : | 978-1-4244-2781-9 |
book e-ISBN : | 978-1-4244-2782-6 |
DOI | 10.1109/VDAT.2009.5158121 |
book ISBN : | 978-1-4244-2781-9 |
book e-ISBN : | 978-1-4244-2782-6 |
DOI | 10.1109/VDAT.2009.5158121 |