The following topics are dealt with: nonvolatile memory devices; storage devices; nonstoichiometric films; thermal stability; thermal oxidation; fully CMOS compatible WOx resistive random access memory (RRAM); hybrid redox molecular/silicon field-effect memory devices; resistive switching memory device; reliability; NiO-based resistive switching memory elements; dynamic random access memory (DRAM); flash memories; embedded nonvolatile memory; phase change memory; nanocrystal memories; and advance dielectrics.