26th IEEE VLSI Test Symposium (vts 2008) > 371 - 376
Source
Abstract
Identifiers
book ISSN : | 1093-0167 |
book ISBN : | 0-7695-3123-7 , 978-0-7695-3123-6 |
DOI | 10.1109/VTS.2008.15 |
26th IEEE VLSI Test Symposium (vts 2008) > 371 - 376
book ISSN : | 1093-0167 |
book ISBN : | 0-7695-3123-7 , 978-0-7695-3123-6 |
DOI | 10.1109/VTS.2008.15 |