It was proposed in earlier work that change in voltage drop after aging be used to rate the performance of power contacts. In that paper it was shown that end-of-life failure criteria could be empirically modeled as a function of current for a given set of accelerated tests. This was established using a statistical model for the end-of-life change in voltage drop. The present paper expands on the previous work by extending the database to include samples with and without aging. In addition, the aged samples are exposed to accelerated-tests that go beyond the previous work. Consequently, in addition to modeling the end-of-life criterion, the progression of degradation is modeled to complete the picture. With both the failure criteria and voltage change modeled as functions of current and thermal aging respectively, a statistical method of rating power contacts in terms of current level and expected field life is developed. The database is obtained empirically by conducting high current cycling tests after accelerated aging of tin plated power contacts. This approach enabled the development of change in voltage drop failure criteria and mean change in voltage drop as functions of current level and accelerated aging respectively. The results are analyzed using basic contact theory in conjunction with an exponential statistical model. Moreover, it is shown that current density and the associated localized power dissipation are basic physical parameters that link aging to failure criteria. The end result is the development of a method using voltage drop to quantify the current level at which power contacts reliably work under a given set of field conditions.