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YBa2Cu3O7−x (YBCO) films of 110nm thickness were prepared on LaAlO3 (LAO) substrates via the sol–gel method. Subsequently, about 400nm thick Ba0.09Sr0.91TiO3 (BST) films were epitaxially grown on the YBCO and LNO films surface; the BST films exhibited a strong c-axis orientation. The dielectric adjustability and relative dielectric constant was investigated in the range of 300-83K. Results indicate...
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