The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Ultrafast nanocalorimetry on the basis of thin-film gauges was developed and utilized for studying phase-transition kinetics in thin-film samples. Ultrafast measurements at increasing rates of temperature change require a comprehensive analysis of the heat conduction processes. In this paper the analysis of the fast thermal response in thin-film samples at the boundary conditions corresponding to ultrafast calorimetric gauges is performed. The effects of interfacial thermal contact resistance and non-Fourier heat conduction are calculated analytically. The limits of validity of the classical diffusive heat conduction theory at high-frequency temperature-modulation measurements are studied. The alternatives of Fourier and non-Fourier heat conduction are considered. The conditions optimal for detection of the effect of non-Fourier heat conduction are defined.