Optik - International Journal for Light and Electron Optics
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 347-352
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 43-48
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 1187-1192
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 412-423
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 892-907
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 1100-1103
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 812-821
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 57-62
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 917-923
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 822-825
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 940-952
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 1040-1046
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 1003-1011
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 63-71
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 494-508
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 1012-1018
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 249-256
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 1111-1116
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 509-518
Optik - International Journal for Light and Electron Optics > 2018 > 172 > C > 161-176