Since many of the phenomena occurring in soil are related to grain and pore sizes and their distribution, investigation on a micrometric scale is of great importance. Also, the investigation should be non-invasive in order to avoid disturbing the region of interest of the sample. Many techniques from various areas of science have been adapted to make such investigations, but most of them are invasive or can only analyze global soil properties. Thus an X-ray tomograph was developed at Embrapa-Agricultural Instrumentation, to scan images of soil samples on a micrometric scale. A microtomographic image of a sieved soil sample, presenting aggregates from 212 μm to 250 μm and pores of 100 μm, is shown. Pores of the same size can also be seen in a microtomograph of a sand column, composed of two layers with granulometries of 106 μm to 149 μm and 297 μm to 500 μm. A microtomograph of a column composed of three layers of an orthoclasius powder is also presented. A slight variation in density along the column height can be observed.