Thin films of Co–Fe–Si were vacuum evaporated on pre-cleaned float glass substrates employing thermal evaporation. The films were subsequently irradiated with 100MeV Ag +7 ions at fluences of 1×10 11 , 1×10 12 and 1×10 13 ions/cm 2 . The pristine and irradiated samples were subjected to surface analysis using Atomic Force Microscopy (AFM), Vibrating Sample Magnetometry (VSM) and Magneto Optic Kerr Effect (MOKE) measurements. The as deposited film has a root mean square roughness (Rq) of 8.9nm and an average roughness of (Ra) 5.6nm. Irradiation of the as deposited films with 100MeV Ag 7+ ions modifies the surface morphology. Irradiating with ions at fluences of 1×10 11 ions/cm 2 smoothens the mesoscopic hill-like structures, and then, at 1×10 12 ions/cm 2 new surface structures are created. When the fluence is further increased to 1×10 13 ions/cm 2 an increase in the surface roughness is observed. The MOKE loop of as prepared film indicated a squareness ratio of 0.62. As the film is irradiated with fluences of 1×10 11 ions/cm 2 , 1×10 12 ions/cm 2 and 1×10 13 ions/cm 2 the squareness ratio changes to 0.76, 0.8 and 0.86 respectively. This enhancement in squareness ratio towards 1 is a typical feature when the exchange interaction starts to dominates the inherent anisotropies in the system. The variation in surface magnetisation is explained based on the variations in surface roughness with swift heavy ion (SHI) irradiation.