We report the development of an all-sputter-deposited buffer multilayer architecture for the growth of high critical current density (J c ) YBa 2 Cu 3 O 7 - δ (YBCO) films on metallic tapes. The structure comprises the layer sequence of CeO 2 /YSZ/LNO (YSZ: yttria stabilized zirconia, LNO: LaNiO 3 ) on biaxially textured Ni substrates. X-ray diffraction analysis of the base LaNiO 3 (LNO) layers indicated that well textured films can be obtained at deposition temperatures (T d e p ) between 450 o C and 500 o C, while higher T d e p yielded polycrystalline films. The degree of LNO crystallinity was also influenced by the oxygen partial pressure during the growth. Scanning electron microscopy observations revealed a smooth, dense and crack-free surface morphology, independent of film thickness in the range of 50-300 nm. Subsequent YSZ and CeO 2 films were deposited to complete the buffer-layer structure. Epitaxial YBCO films grown by pulsed laser ablation on the CeO 2 /YSZ/LNO/Ni multilayer structure have self-field J c values as high as 1.3x10 6 A/cm 2 at 77 K. Effects of the LNO base-layer thickness on the quality of buffers and on the superconducting properties of YBCO films showed no remarkable differences. The present results demonstrate a viable approach for the production of long length YBCO superconducting wires.