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The dose dependence of the exchange bias field modification by He-ion bombardment in an applied magnetic field was investigated for an oxidic antiferromagnet/ferromagnet bilayer system consisting of NiO/NiFe in continuation of previous investigations for metallic antiferromagnet/ferromagnet systems (FeMn/NiFe, PtMn/NiFe, CrMn/NiFe). For low ion doses (<1.5x10 15 ions/cm 2 ),...
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