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The structural and magnetic properties of as-grown 5–50nm thin ion-beam sputter deposited transition metal–metalloid Co 20 Fe 60 B 20 (CFB) films are reported in this communication. A broad peak observed at 2θ∼45° in the glancing angle X-ray diffraction pattern revealed the formation of very fine nano-sized grains embedded in majority amorphous CFB matrix. Although no magnetic...
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