The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
We present the results of an atomic force microscopy study of the self-assembly of poly(p-xylylene tetrahydrothiophenium) (precursor PPV) and poly(styrene sulphonate) (PSS) on functionalised fused quartz substrates. The morphology of these polyelectrolyte films depends on the ionic strength (I) of the assembly solutions. The film surface can be tuned from a non-scattering state to a highly-scattering one as the film roughness increases with I. The results suggest that polymer chain conformations vary significantly with the ionic environment present during self-assembly and this should be taken into account when interpreting photophysical results of these systems.