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The band alignment at the ZnO/TiO 2 hetero-structure interface was measured by high resolution X-ray photoelectron spectroscopy. The valence band offset (EZnO−ETiO2)Valence was linearly changed from 0.27 to 0.01eV at the interface with increased ZnO coating thickness from 0.7 to 7nm. The interface dipole presented at the ZnO/TiO 2 interface was responsible for the decreased band offset...
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