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ZnO:TM (TM=Mn, Co, Fe) thin films doped with different average doping levels (x=1–9%) were successfully deposited on glass substrates by radio frequency magnetron sputtering technique. The results showed that all the undoped and doped films possessed a strong preferential c-axis orientation with a hexagonal polycrystalline structure. With increased TM doping level, a clear decrease in crystalline...
Pure and manganese doped cerium oxide (CeO2 & Mn-CeO2) thin films were deposited on glass substrates by employing rf magnetron sputtering having CeO2 and Mn-CeO2 targets. Deposited films were characterized by using X-ray diffractometer (XRD), X-ray photoelectron spectroscopy (XPS), photoluminescence (PL), atomic force microscope (AFM) and vibrating sample magnetometer (VSM). XRD patterns reveal...
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