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An X-ray diffraction (XRD) simulation software based on the supercell model has been developed, which can calculate X-ray rocking curves of layered film/substrate systems by considering the attenuation of the amplitude of an X-ray beam due to an absorption effect. Considering the changes in the lattice constants along the thickness direction of LiNbO 3 /LiNbO 3 (LN/LN) epitaxial films...
The quantitative analysis of Li content in the liquid-phase epitaxial (LPE) grown LiNb 1-x Ta x O 3 (LNT) film by combining high-resolution X-ray diffractometry (HR-XRD) and electron probe microanalysis (EPMA) is proposed. The X-ray rocking curves of the LNT films grown on LiNbO 3 (LN) substrates are simulated, and then the interface sharpness is analyzed...
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