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Far-field high-energy X-ray diffraction microscopy is used to asses the evolution of slip system strengths in hexagonal close-packed (HCP) Ti-7Al during tensile deformation in-situ. The following HCP slip system families are considered: basal 〈a〉, prismatic 〈a〉, pyramidal 〈a〉, and first-order pyramidal 〈c+a〉. A 1 mm length of the specimen's gauge section, marked with fiducials and comprised of an...
A robust methodology is presented to extract slip system strengths from lattice strain distributions for polycrystalline samples obtained from high-energy x-ray diffraction (HEXD) experiments with in situ loading. The methodology consists of matching the evolution of coefficients of a harmonic expansion of the distributions from simulation to the coefficients derived from measurements. Simulation...
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