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Mg x Ni 1−x O (x=0.25–0.56) thin films were fabricated by radio frequency (RF) magnetron sputtering on a quartz substrate. The influences of different Mg contents on the bang-gap of Mg x Ni 1−x O thin films have been studied. XRD measurements indicate that the Mg x Ni 1−x O films are of cubic NiO structure with a (111)-preferred orientation. UV–visible transmission spectra show that the absorption edges of thin films shift to short wavelength with increasing Mg content. The band-gap is already in the solar-blind region when the Mg content in the film is 46%. XPS results showed that typical sosoloid of Mg x Ni 1−x O has been prepared without obvious phase separation. The result implies that MgNiO is a promising candidate material for solar-blind UV detection.