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TiO 2 amorphous films have been pulsed laser deposited onto glass substrates. Film characterization by X-ray diffraction, atomic force microscopy and transmission spectroscopy was performed with the aim of extracting the information on the film crystalline structure, surface roughness and optical properties. Three methods for improving film optical performance have been employed, namely deposition...
An accurate characterization method is developed to determine the refractive index of smooth and surface-textured transparent conductive oxide (TCOs) films. The properties are obtained from simultaneous fitting of simulated specular reflectance/transmittance spectra to spectroscopic measurements for different polarizations and angles of light incidence. The simulations are based on a combination of...
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