The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Transmission ellipsometry is a technique that is very sensitive to the anisotropy of a material. At large angles of incidence it is also very sensitive to the change of the refractive index at the interfaces. This work applies Berreman's 4×4 algebraic descriptions of light transmission in layered bianisotropic media. When the optical response of thick layers is modeled, the calculated spectra show...
Principle and analysis for ellipsometers usable in the vacuum ultraviolet (VUV) region up to about 25eV, which are consisting of a sample mirror and an inclined photodiode, are described. Our ellipsometer has two degrees of freedom in rotation; the main chamber can rotate around the axis of incidence and, the analyzer unit can also rotate around the axis of reflection. All the unknown parameters (Stokes...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.