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Uranium dioxide thin films were deposited on single crystal TiO2, Al2O3, YSZ, ZnO and NdGaO3 substrates to optimize conditions for the growth of high quality single crystal films. X-ray diffraction results show that all the films have one growth direction and well defined peaks in the specular scans with the expected symmetry for each growth orientation. The UO2/Al2O3, TiO2, and ZnO films have high...
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