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Well defined reference materials consisting of Irganox 1010 and either Irganox 1098 or Fmoc-pentafluoro-l-phenylalanine (Fmoc-PFLPA) are described. These have been analysed with time-of-flight secondary ion mass spectrometry (ToF-SIMS) using argon gas cluster ions, 5keV Ar2000+, as a sputtering source and 25keV Bi3+ ions as a primary source for analysis. We demonstrate that the binary mixtures of...
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