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For the comprehensive characterization of nanoparticles cross-sectional investigation on the atomic scale by analytical and high-resolution transmission electron microscopy (TEM) is indispensable. Cross-sectioning is especially important for anisotropic nanoparticles to gain information on structure and chemistry along all important projections. We present a focused ion beam (FIB) method for site-...
We assess the imaging performance of a transmission electron microscopy (TEM) system operated at a relatively low acceleration voltage using the three-dimensional (3D) Fourier transform of through-focus images. Although a single diffractogram and the Thon diagram cannot distinguish between the linear and non-linear TEM imaging terms, the 3D Fourier transform allows us to evaluate linear imaging terms,...
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