The crystallization behavior and microstructure of R 2 O–Al 2 O 3 –SiO 2 (R means K, Na and Li) glass were investigated by means of differential scanning calorimeter (DSC), X-ray diffraction (XRD) and scanning electron microscopy (SEM). The crystallization kinetic parameters including the crystallization apparent activation energy (E a ), the Avrami parameter (n), glass transition temperature (T g ) and the activity energy of glass transition (E t ) were also measured with different methods. The results have shown that: the DSC traces of composition A parent glass have two different precipitation crystallization peaks corresponding to E a1 (A)=151.4kJ/mol (Li 2 SiO 3 ) and E a2 (A)=623.1kJ/mol (Li 2 Si 2 O 5 ), the average value of n=1.70 (Li 2 Si 2 O 5 ) for the surface crystallization and E t (A)=202.8kJ/mol. And E a (B)=50.7kJ/mol (Li 2 SiO 3 ), the average value of n=3.89 (Li 2 SiO 3 ) for the bulk crystallization and E t (B)=220.4kJ/mol for the composition B parent glass. Because of the content of R 2 O is bigger than composition A, composition B parent glass has a lower E a , T g and a larger n, E t .