The line intensities of emission from 4f 2 1 S 0 are calculated in Pr 3+ -doped SrAl 12 O 19 by considering the mixing of 1 S 0 state with the corresponding 4f5d components. The products of odd-rank crystal-field parameters B kq (fd)'s and interconfigurational radial integral r are treated as new parameters and obtained from a best-fit of the calculated and measured relative intensities of transitions from the 1 S 0 level to the lower J multiplets. The fitted values are B 33 (fd)r=1.207×10 −5 and B 53 (fd)r=1.522×10 −5 , which are then used to calculate the line intensities of transitions from the 1 S 0 to the lower crystal-field levels.